FLIP CHIP VERTICAL BLADE TYPE FOR INSPECTION We Implement optimized product to meet customer needs. We have ability to fit technology to suit customer condition. High Current Response Chip, WAFER form, The probe area is not above the top, is the bottom of the element that is inverted.
This product measures the light and emitting signal at the upper to determine whether it is defective or not. A type of patent/ 3 types of design registration / technology deposit Completion

PIN TYPE For optical measurement inspection We Implement optimized product to meet customer needs and Obtained a large amount of patent technology. We have ability to fit technology to suit customer condition.(high power micro led etc..)
This product uses a small amount of elements in LED CHIP, WAFER FORM to measure the light and emitting signal to determine whether it is defective or not.