FLIP CHIP VERTICAL BLADE TYPE FOR INSPECTION
We Implement optimized product to meet customer needs. We have ability to fit technology to suit customer condition.
High Current Response Chip, WAFER form, The probe area is not above the top, is the bottom of the element that is inverted.
This product measures the light and emitting signal at the upper to determine whether it is defective or not. A type of patent/ 3 types of design registration / technology deposit Completion
PIN TYPE For optical measurement inspection
We Implement optimized product to meet customer needs and Obtained a large amount of patent technology.
We have ability to fit technology to suit customer condition.(high power micro led etc..)
This product uses a small amount of elements in LED CHIP, WAFER FORM to measure the light and emitting signal to determine whether it is defective or not.
본 웹사이트에 게시된 이메일 주소가 전자우편 수집 프로그램이나 그 밖의 기술적 장치를 이용하여 무단으로 수집되는 것을 거부하며, 이를 위반시 정보통신망법에 의해 형사 처벌됨을 유념하시기 바랍니다.